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A mineral / phase
identification and quantification service is offered directly by
Sietronics.
Sietronics use the latest
Bruker-AXS D4 Diffractometer for the XRD analysis (see right). This instrument
combines a high resolution goniometer with state of the art electronics for a
rapid turnaround of sample analysis.
The method used is to
first identify the crystalline phases or minerals present in the sample. This is
determined by using the Bruker-AXS Diffracplus software and
the latest ICDD database. Traditionally, this has been a qualitative
determination however, for most geological samples and industrial materials, a
quantitative determination is possible using Siroquant. This method also allows
the non-crystalline (amorphous or glass) content to be measured.
The output from the
analysis is a written report in Microsoft Word format with the phase list and
concentrations as well as the diffraction scan with the peak identification
overlaid. This format can be modified to suit your preference. The XRD scan
can be inserted into other documents as required.
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