Spectro iQ II

The sensitivity, precision and speed of analytical instruments are of particular importance for industrial process control applications. The SPECTRO iQ already set standards in this respect. The new SPECTRO iQ II maintains this course with further improved technologies and a consequent alignment towards simplicity and dependability of operation.

For many applications the measurement precision of major components and the sensitivity for important trace elements place the SPECTRO iQ II into the same performance class as the much more expensive wavelength dispersive X-ray fluorescence spectrometers. Applications that were previously the domain of these types of instruments can now be handled using SPECTRO’s unique energy-dispersive technology.

Clarity, simplicity and focus: All hallmarks of the SPECTRO iQ II software. The new graphical user interface displays all important functions for routine operation at a glance. A touch screen can make operation even less complicated and more intuitive.

The SPECTRO iQ II offers higher spectral resolution and lower detection limits for numerous elements. Altogether, this leads to measurement results with higher accuracy and reproducibility – especially for difficult matrices. For example, the strong sulfur signal present when examining lubricating oils can obscure the lines of several trace elements. The new detector performs more precisely here, and the user receives more accurate results. This applies to other applications, and a number of application packages already are available for the SPECTRO iQ II, including analysis of additives in oil, cement, slag and ceramics.

Spectro Xepos

Hidden inside the new SPECTRO XEPOS are powerful components delivering new levels of sensitivity and accuracy. Optimum excitation using polarization and secondary targets, an autosampler for up to 12 items and intelligent software modules, make the instrument the most versatile elemental analyser available.

The SPECTRO XEPOS can be delivered with pre-installed application packages. The application packages are a combination of hardware and analytical methods; installed in the factory and individually tuned.

The range of applications includes, among others: The analysis of waste, soils, sewage sludge, additives in oil, cement, slag, refractories and electronic components and parts in compliance with RoHS. The XEPOS is also well suited for the chemical and petrochemical industries, the examination of ores and concentrates, and analysis of coatings making the XEPOS a true multi-talent.

By using additional secondary targets, the detection limits for certain elements can be lowered even further. These lower detection limits make the XEPOS suitable for a number of environmental applications that previously had not been accessible to conventional ED-XRF instruments.

The latest version of the XEPOS is equipped with a state-of-the-art Si-drift detector and achieves much lower detection limits than its predecessor, especially for the analysis of light elements.

The precision sample plate of the new XEPOS is tailor made for laboratory procedures: It possesses twelve positions for samples between 32mm and 40 mm in diameter. This allows laboratory operators to set up the XEPOS and place it in automatic analysis mode for safe, unattended operation. The latest version of XEPOS also offers updated software and an easy-to-use and intuitive method wizard that guides users step-by-step through method development.