SPL logo

Particle Sizing

Particle Size Analysers


layout cpaHaver CPA Photo Optical

The HAVER-CPA measuring system is protected by national and international patents: DBP-No. DE 41 19 240 C2, EP-No. 0 518 188 B1, US Patent 5,309,215 and other foreign patents.

Using fiberoptic technology, this high-resolution measuring unit has been developed for particle size and shape analysis of dry and individual non agglomerating particles in bulk materials. Thanks to the HAVER & BOECKER REAL TIME function, it can also be used as a particle counting device. This new technology guarantees that all particles are detected and analysed. The common ‘double-count’ caused by overlapping matrix-pictures in other systems are eliminated using this new technology. Faulty analysis due to undersize particles is also excluded. The digital CCD Line Camera calculates the equivalent of more than 24 mega pixels of a matrix camera. It can generate very large pictures of 128 mega pixels and more.


layout cpa2The HAVER CPA analyses and calculates up to 10,000 particles per second. The particle size and shape calculations are performed pixel by pixel, independent of the angle of the particle. The unit can store each single particle, with all particle shape values. This single particle storage enables an almost infinite grading of the size classes. All particles can be stored as TIF image files for further analysis. The hardware offers a pixel size of 10 µm and guarantees an extremely high resolution even with ultra-fine particle mixtures.








40 Hoskins St, (PO Box 695), Mitchell, ACT 2911
Telephone : +61 (0)2 6246 9299
Fax : +61 (0)2 6241 5771
Email : spl@sietronics.com.au


67 Howe Street Osborne Park WA 6017
Email : splwa@sietronics.com.au


55 Curzon Street Tennyson, QLD 4105
Telephone : +61 430 545 725
Fax : +61 2 6241 5771
Email : splqld@sietronics.com.au